The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
Feb. 09, 1998
Toyoharu Okumoto, Hitachinaka, JP;
Masamichi Tsukada, Higashiibaraki-gun, JP;
Akira Owada, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A plasma ion source mass spectrometer comprising a plasma ion source,for ionizing a sample with a plasma; a mass filter,for subjecting the sample ionized by the plasma ion source,to mass spectrometry; and an interface unit,having an orifice formed in a cone,for introducing the sample ionized by the plasma ion source,into the mass filter,. Further the plasma ion source mass spectrometer comprises a first cooler,for cooling a plasma generator,of the plasma ion source,and a plasma generating power source,; and a second cooler,independent of the first cooler,, for cooling the interface unit,and for raising the temperature by changing the cooling efficiency so as to reduce the influence of deposition on the interface unit,. With this construction, the temperature of the interface unit can be controlled without changing the analysis sensitivity of the plasma ion source mass spectrometer.