Company Filing History:
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1 out of 832,880 Years Active: 1990-2005
Title: Toshiaki Miyokawa: Innovator in Electron Microscopy and Beam Irradiation
Introduction
Toshiaki Miyokawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of electron microscopy and electron beam irradiation. With a total of 3 patents, his work has advanced the capabilities of testing and measurement technologies.
Latest Patents
Miyokawa's latest patents include a testing apparatus using a scanning electron microscope. This innovative device enables tests and measurements on any part of a test subject in a nondestructive manner, without being limited by the size of the test subject. The apparatus features a local vacuum formation portion that creates a vacuum region around the test area, allowing for precise measurements. Another notable patent is a system and method for electron beam irradiation. This system is designed to shoot an electron beam at a master disk for recording purposes. It allows for easy and accurate focusing of the beam, ensuring high-quality recordings.
Career Highlights
Throughout his career, Toshiaki Miyokawa has worked with notable companies, including Jeol Ltd. His expertise in electron microscopy and beam technology has positioned him as a key figure in these industries.
Collaborations
Miyokawa has collaborated with esteemed colleagues such as Setsuo Norioka and Naoki Date. Their combined efforts have contributed to advancements in their respective fields.
Conclusion
Toshiaki Miyokawa's innovative work in electron microscopy and electron beam technology has led to significant advancements in testing and measurement techniques. His contributions continue to influence the industry and inspire future innovations.