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For the Inventor, By the Inventor

Nirasaki, Japan

Tomoya Endo

USPTO Granted Patents = 14

Average Co-Inventor Count = 1.4

ph-index = 3

Forward Citations = 22(Granted Patents)


Location History:

  • Nirasaki, JP (2011 - 2022)
  • Yamanashi, JP (2019 - 2022)

Company Filing History:

goldMedal14 out of 10,346 
 
Tokyo Electron Limited
 patents

Years Active: 2011-2022

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14 patents (USPTO):Explore Patents
1. 11454667 - Inspection apparatus and method of adjusting position of chuck top (2022-09-27),
2. 11454664 - Testing system (2022-09-27),
3. 11391758 - Testing apparatus and method of controlling testing apparatus (2022-07-19),
4. 11385286 - Method for controlling test apparatus and test apparatus (2022-07-12),
5. 11360115 - Inspection system (2022-06-14),
6. 11226368 - Placement apparatus control method, placement apparatus, and inspection apparatus (2022-01-18),
7. 11181573 - Inspection apparatus and cleaning method of inspection apparatus (2021-11-23),
8. 11133214 - Substrate transportation method (2021-09-28),
9. 11131708 - Aligning mechanism and aligning method (2021-09-28),
10. 10809294 - Stage device and probe device (2020-10-20),
11. 10205279 - Interface apparatus, interface unit, probe apparatus, and connection method (2019-02-12),
12. 8130004 - Probe apparatus and method for correcting contact position by adjusting overdriving amount (2012-03-06),
13. 7994809 - Transfer mechanism for target object to be inspected (2011-08-09),
14. 7944200 - Probe apparatus (2011-05-17),

Title: **Tomoya Endo: Innovating the Future of Electronics Inspection**

Introduction

Tomoya Endo, an accomplished inventor based in Nirasaki, Japan, has made significant contributions to the field of electronics inspection technology. With a remarkable portfolio of 14 patents, he has paved the way for innovations that enhance the accuracy and efficiency of electronic device evaluations.

Latest Patents

Among his latest inventions, Tomoya has developed an inspection apparatus and a method for adjusting the position of chuck tops. This sophisticated apparatus incorporates multiple inspection devices to evaluate electronic components on various chuck tops. A key feature is its measurement device, which accurately measures height positions or distances from a reference point on each chuck's surface. It also includes a calculation device that determines necessary adjustments in height for optimal inspection and an adjustment mechanism that aligns the chuck tops based on these calculations. Another notable invention is his testing system, which comprises inspection modules containing multiple inspection chambers. This system facilitates electrical inspections of electronic devices and ensures alignment through its dedicated aligner module, streamlining the entire inspection process.

Career Highlights

Tomoya Endo currently works at Tokyo Electron Limited, a leader in the semiconductor and electronics manufacturing equipment sector. His innovative mindset and engineering expertise have been instrumental in advancing testing technologies in the industry.

Collaborations

During his career, Tomoya has collaborated with notable coworkers, including Hiroshi Yamada and Takanori Hyakudomi. Their combined efforts have fostered a creative and productive environment, leading to numerous advancements and patents in electronics inspection methodologies.

Conclusion

Tomoya Endo exemplifies the spirit of innovation through his dedication to enhancing electronic inspection processes. With 14 patents to his name, his work at Tokyo Electron Limited continues to influence and inspire advancements in the semiconductor industry, ensuring higher precision and efficiency in the evaluation of electronic devices.

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