Miyagi, Japan

Tomohisa Kitayama

USPTO Granted Patents = 2 

Average Co-Inventor Count = 2.4

ph-index = 1


Company Filing History:


Years Active: 2021-2024

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2 patents (USPTO):Explore Patents

Title: Innovations by Tomohisa Kitayama

Introduction

Tomohisa Kitayama is a notable inventor based in Miyagi, Japan. He has made significant contributions to the field of substrate processing and calibration methods, holding two patents that showcase his innovative approach to technology.

Latest Patents

Kitayama's latest patents include a correction data creating method and a substrate processing system. The correction data creating method involves selecting a source voltage from a predetermined set and supplying it to a heater that heats a substrate support. The method adjusts the power supplied to the heater to ensure that its resistance corresponds to a specific temperature, allowing for accurate temperature measurement and correction data creation. His second patent focuses on a calibration method for infrared cameras, which entails setting a substrate placing table to various temperatures and measuring the infrared radiation emitted from different zones. This method calculates calibration values and stores parameters for accurate infrared camera performance.

Career Highlights

Tomohisa Kitayama works at Tokyo Electron Limited, a leading company in the semiconductor manufacturing equipment industry. His work has contributed to advancements in substrate processing technologies, enhancing the efficiency and accuracy of manufacturing processes.

Collaborations

Kitayama collaborates with talented coworkers, including Hiroki Endo and Takashi Kubo. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Tomohisa Kitayama's contributions to substrate processing and calibration methods highlight his role as a significant inventor in the technology sector. His patents reflect a commitment to improving manufacturing processes and enhancing technological capabilities.

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