The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Nov. 27, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Tomohisa Kitayama, Miyagi, JP;

Takashi Kubo, Miyagi, JP;

Takari Yamamoto, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 17/00 (2006.01); G01J 5/00 (2006.01); G01J 5/02 (2006.01); G01J 5/52 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); G01J 5/00 (2013.01); G01J 5/02 (2013.01); G01J 5/522 (2013.01); H04N 17/002 (2013.01); G01J 2005/0048 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A calibration method of an infrared camera includes setting a placing table on which a substrate is placed to different temperatures and acquiring a measurement value of radiation amount of infrared light emitted from each of multiple zones provided in a top surface of the placing table by an infrared camera at each of the temperatures; calculating, as a calibration value, a difference between a measurement value of a reference zone which is one of the zones provided with a temperature sensor and a measurement value of another one of the zones at each of the temperatures; specifying an interpolation curve indicating a variation tendency of the calibration value with respect to the measurement value of the reference zone for each of the zones; and storing parameters of the interpolation curve specified for each of the zones.


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