The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Jun. 24, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Hiroki Endo, Miyagi, JP;

Tomohisa Kitayama, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); F27D 5/00 (2006.01); H01J 37/32 (2006.01); H01L 21/683 (2006.01); H05B 1/02 (2006.01); H05B 3/22 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67103 (2013.01); F27D 5/0037 (2013.01); H01J 37/32724 (2013.01); H01L 21/67248 (2013.01); H01L 21/6833 (2013.01); H05B 1/0233 (2013.01); H05B 3/22 (2013.01); H01J 2237/2001 (2013.01); H05B 2203/005 (2013.01); H05B 2203/035 (2013.01); H05B 2213/07 (2013.01);
Abstract

A correction data creating method is provided. In the method, a source voltage is sequentially selected among a plurality of source voltages determined in advance and the selected source voltage is supplied to a heater for heating a substrate support. At the source voltage supplied to the heater, a power supplied to the heater is adjusted such that a resistance of the heater becomes a resistance value corresponding to a predetermined first temperature based on temperature conversion data indicating a relationship between the resistance of the heater and a temperature of the heater. A temperature of the substrate support is measured at a position where the heater is disposed as a second temperature. A correction value corresponding to the difference between the predetermined first temperature and the second temperature is calculated, and correction data indicating a corresponding relationship between each of the source voltages and the correction value is created.


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