IDiyas

For the Inventor, By the Inventor

Kanagawa, Japan

Tomohide Watanabe

USPTO Granted Patents = 7

Average Co-Inventor Count = 2.1

ph-index = 4

Forward Citations = 61(Granted Patents)


Location History:

  • Kawasaki, JP (1980)
  • Yokohama, JP (1986 - 2008)
  • Kanagawa, JP (2013)

Company Filing History:

goldMedal5 out of 52,711 
 
Kabushiki Kaisha Toshiba
 patents
silverMedal2 out of 2,916 
 
Tokyo Shibaura Denki Kabushiki Kaisha
 patents
bronzeMedal1 out of 1,033 
 
Kabushiki Kaisha Topcon
 patents
4. 1 out of 716 
 
Nuflare Technology, Inc.
 patents
where one patent can have more than one assignee

Years Active: 1980-2013

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7 patents (USPTO):Explore Patents
1. 8358340 - Pattern inspection device and method of inspecting pattern (2013-01-22),
2. 7394048 - Focusing device, focusing method and a pattern inspecting apparatus (2008-07-01),
3. 5602645 - Pattern evaluation apparatus and a method of pattern evaluation (1997-02-11),
4. 5379348 - Pattern defects inspection system (1995-01-03),
5. 4743768 - Method and apparatus for measuring non-linearity of a pattern edge (1988-05-10),
6. 4577095 - Automatic focusing apparatus for a semiconductor pattern inspection (1986-03-18),
7. 4230940 - Automatic focusing apparatus (1980-10-28),
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