Location History:
- Kawasaki, JP (1980)
- Yokohama, JP (1986 - 2008)
- Kanagawa, JP (2013)
Company Filing History:
5 out of 52,751 
2 out of 2,916 
1 out of 1,033 Years Active: 1980-2013
Title: Tomohide Watanabe: Innovator in Pattern Inspection Technology
Introduction
Tomohide Watanabe is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of pattern inspection technology, holding a total of 7 patents. His innovative work has advanced the methods and devices used in inspecting patterns, which are crucial in various industries.
Latest Patents
Watanabe's latest patents include a pattern inspection device and method of inspecting patterns. This device features an image picking-up portion that captures images of a pattern formation member with multiple opening patterns. It also includes a reference image obtaining portion for comparison with the picked-up image. The pattern defect detecting portion matches the center locations of the opening pattern images between the picked-up and reference images, forming difference images to detect defects based on these comparisons.
Another notable patent is a focusing device that comprises a first and second imaging optical system. The second system splits the optical image to create front and back focus images on an AF sensor. A focus detecting circuit identifies the optimum focus position based on high-frequency components from both front and back sensor images. The focus control circuit then adjusts the focusing of the first imaging optical system accordingly.
Career Highlights
Throughout his career, Watanabe has worked with notable companies such as Toshiba Corporation and Tokyo Shibaura Electric Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies in pattern inspection.
Collaborations
Watanabe has collaborated with several professionals in his field, including Toshiyuki Watanabe and Toru Tojo. These collaborations have fostered innovation and the sharing of ideas, further enhancing the development of pattern inspection technologies.
Conclusion
Tomohide Watanabe's contributions to pattern inspection technology through his patents and collaborations highlight his role as a key innovator in this field. His work continues to influence advancements in technology and industry practices.