Timothy M Platt

Title: Innovations of Timothy M Platt

Introduction

Timothy M Platt is a notable inventor based in Williston, VT (US). He has made significant contributions to the field of semiconductor testing, holding a total of 7 patents. His work focuses on advanced testing devices and techniques that enhance the performance and reliability of semiconductor structures.

Latest Patents

Among his latest patents is the "Probe for pic die with related test assembly and method." This invention provides a probe structured for electrical and photonics testing of a photonic integrated circuit (PIC) die. The probe includes a membrane with conductive traces, a set of probe tips for sending and receiving electrical test signals, and a photonic test assembly for alignment with a photonic I/O element of the PIC die. Another significant patent is the "Absolute phase measurement testing device and technique." This device includes a first frequency input source, an up-converter, a down-converter, and a digitizer, all designed to facilitate precise testing of semiconductor structures.

Career Highlights

Timothy has worked with prominent companies in the technology sector, including International Business Machines Corporation (IBM) and Globalfoundries U.S. Inc. His experience in these organizations has contributed to his expertise in semiconductor technology and testing methodologies.

Collaborations

Throughout his career, Timothy has collaborated with talented individuals such as Mustapha Slamani and Richard Jean-Luc St-Pierre. These collaborations have likely enriched his work and led to innovative advancements in the field.

Conclusion

Timothy M Platt's contributions to semiconductor testing through his patents and collaborations highlight his role as a significant inventor in the industry. His innovative approaches continue to influence the development of advanced testing technologies.