International Business Machines Corporation

Globalfoundries U.S. Inc.

Globalfoundries Inc.

Timothy M Platt

Mustapha Slamani

Richard Jean-Luc St-Pierre

Hanyi Ding

Susan K Lichtensteiger

Tian Xia

Phillip Paul Normand

Kaushal Kannan

Ritin Nambiar

Ye Wang

Thomas Moon

Embodiments of the disclosure provide a probe structured for electrical and photonics testing of a photonic integrated circuit (PIC) die, the probe including: a membrane having a first surface and an opposing second surface and including conductive traces, the membrane being configured for electrical coupling to a probe interface board (PIB); a set of probe tips positioned on the membrane, the set of probe tips being configured to send electrical test signals to the PIC die or receive electrical test signals from the PIC die; and a photonic test assembly disposed on the membrane and electrically coupled to the conductive traces of the membrane, the photonic test assembly positioned for substantial alignment with a photonic I/O element of the PIC die, wherein the photonic test assembly is configured to transmit a photonic input signal to the photonic I/O element or detect a photonic output signal from the photonic I/O element.

Probe for pic die with related test assembly and method

The present disclosure relates to a testing device and techniques of testing semiconductor structures and, more particularly, to an absolute phase measurement testing device and technique of testing semiconductor structures. The structure includes: a first frequency input source which provides a first signal to an up-converter at an input side of a test fixture; a down-converter on an output side of the test fixture; a second frequency signal source which provides a second signal at a higher frequency than the first signal to the up-converter and the down-converter on the output side of the test fixture; a bypass path which bypasses the test fixture and provides connection between the up-converter and the down-converter; and a digitizer that is connected to an output side of the down-converter.

Absolute phase measurement testing device and technique

A local oscillator signal is output from a local oscillator using a reference signal produced by a reference signal generator. Similarly, a test intermediate frequency signal is output from a source oscillator using the reference signal. The test intermediate frequency signal is converted to a test radio frequency signal, with an up-converter using the local oscillator signal. The test radio frequency signal is supplied to a device under test, and an output radio frequency signal is received back from the device under test. The output radio frequency signal is converted to an output intermediate frequency signal, with a down-converter using the local oscillator signal. The output intermediate frequency signal is converted to a digital output signal, with a synchronized digitizer using the reference signal. Different phase signals of the output intermediate frequency signal are captured using the synchronized digitizer as the device under test is operated during a testing cycle.

Phase measurement for phased array devices using shared local oscillator and synchronized digitizer

A testing system and method incorporate a test signal generator for generating a test signal with multiple tones uniformly distributed across a wideband having a specific bandwidth. This test signal is generated based on user-specified test signal parameter(s) (e.g., using an orthogonal frequency-division multiplexing (OFDM) spread spectrum technique) and processed (e.g., converted from digital to analog or shifted to a different wideband having the same bandwidth), as necessary, so that it is suitable for application to a specific device under test and so that the tones account for the full range of frequencies with the wideband operation of that device under test. After it is applied to the device under test, the resulting output signal is captured, processed (e.g., converted back to digital or shifted back to the initial wideband), as necessary, and analyzed in order to determine the frequency responses associated with each of the tones.

Circuit test system and method using a wideband multi-tone test signal

A method of filtering streaming digital data in real time. The method including: (a) initializing and storing a set of m data elements and an associated set of m pointer data from 1 to m in sequence, m an integer greater than 2; (b) receiving in real time a first or next data element of a digital data stream of sequential data elements; (c) simultaneously with (b), replacing a stored data element associated with the pointer datum m with the received data element, changing the pointer datum of m to 1, and incrementing the value of all other pointer data by 1; (d) simultaneously with (b) sorting in order from a low to high all stored data elements; (e) simultaneously with (b), maintaining the association of pointer datum and data elements; (f) simultaneously with (b), filtering all stored data elements; and (g) repeating (b) through (f) multiple times.

Streaming digital data filter

A circuit and design structure for a streaming digital data filter embodied in a machine readable medium, the design structure including: a data processing unit and a pointer processing unit, the data processing unit and the pointer unit connected to a control logic; the pointer processing unit consisting of n serially connected pointer processing stages from a first to a last pointer processing stage, each pointer processing stage except for the first and last processing stages of the pointer processing unit including a pointer register and a multiplexer, wherein n is a positive integer greater than 2; the data processing unit consisting of n serially connected data processing stages from a first data processing stage to a last data processing stage, each data processing stage including a multiplexer, a data register and a comparator; and one or more filter output stages connected to the data processing unit.

Circuit and design structure for a streaming digital data filter

A method of analysis of an integrated circuit design having multiple voltage islands, including: (a) determining a clock path through the voltage islands; (b) determining a data path through the voltage islands; (c) determining which voltage islands are independent voltage islands; (d) determining which voltage islands are dependent voltage islands; (e) for the data path and the clock path, performing a worst case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in the data and clock paths; and (f) for the data path and the clock path, performing a best case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in the data and clock paths.

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Williston, VT, United States of America

Timothy M Platt