Thomas Krah

Title: Thomas Krah: Innovator in Wafer Metrology

Introduction

Thomas Krah is a notable inventor based in Friedberg, Germany. He has made significant contributions to the field of wafer metrology, particularly through his innovative patent. His work focuses on improving the accuracy of measurements in semiconductor manufacturing.

Latest Patents

Thomas Krah holds a patent for a technology titled "Bonded Wafer Metrology." This invention involves analyzing wafer edge profile images at various locations around a bonded wafer, which consists of a top wafer and a carrier wafer. An offset curve is generated based on these images, allowing for the determination of the displacement between the top wafer and the carrier wafer. The images may be generated as shadowgram images, and the system includes an imaging system connected to a controller. This patent represents a significant advancement in the precision of wafer measurements.

Career Highlights

Throughout his career, Thomas Krah has been associated with Kla Tencor Corporation, a leading company in the field of semiconductor equipment. His work has contributed to the development of technologies that enhance the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations

Thomas has collaborated with talented individuals such as Kaushik Sah and Shifang Li. Their combined expertise has furthered advancements in wafer metrology and related technologies.

Conclusion

Thomas Krah's contributions to wafer metrology through his innovative patent demonstrate his commitment to advancing technology in the semiconductor industry. His work continues to influence the field and improve manufacturing processes.