Location History:
- Glen Allen, VA (US) (2002 - 2005)
- Leca da Palmeira, PT (2006)
Company Filing History:
2 out of 48 
1 out of 244 
1 out of 832,843 Years Active: 2002-2006
Title: Inventor Thomas Hladschik: Innovations in Memory Device Analysis
Introduction
Thomas Hladschik, an accomplished inventor based in Glen Allen, Virginia, has made significant contributions to the field of memory device analysis, holding a total of four patents. His innovative approaches, particularly in analyzing failures of memory devices, have paved the way for advancements in semiconductor technology.
Latest Patents
Among Thomas Hladschik's latest patents is the "Method of and system for analyzing cells of a memory device." This patent introduces a comprehensive method for generating fail signatures associated with various types of failures in memory device cells. By applying multiple test patterns and analyzing fail data, his invention determines the failure types through a detailed voltage application system.
Additionally, he holds a patent for a "Method and apparatus for fast automated failure classification for semiconductor wafers." This inventive methodology involves classifying failcodes on semiconductor wafers by examining the patterns of adjacent chips and determining failcode patterns, significantly enhancing the efficiency of semiconductor testing processes.
Career Highlights
Thomas has worked with notable companies, including Infineon Technologies Richmond, LP, where he honed his expertise in semiconductor technologies. His work in this field has garnered recognition for its innovative edge and practical applications in the industry.
Collaborations
Throughout his career, Thomas Hladschik collaborated with esteemed colleagues such as Peter Oswald and Dieter Rathei. These partnerships have fostered an environment of creativity and innovation, contributing to the success of his inventions.
Conclusion
As an inventor, Thomas Hladschik exemplifies the spirit of innovation within the semiconductor industry. His patents not only address critical failures in memory devices but also enhance the automated processes involved in semiconductor testing. The significance of his work continues to influence the landscape of memory technology and serves as a testament to his dedication as an inventor.