Location History:
- Tokyo, JP (2015 - 2016)
- Hitachinaka, JP (2014 - 2019)
Company Filing History:
Years Active: 2014-2019
Title: Terutaka Nanri: Innovator in Charged Particle Beam Technology
Introduction
Terutaka Nanri is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 4 patents. His work focuses on enhancing the precision and efficiency of charged particle beam devices.
Latest Patents
Nanri's latest patents include a charged particle beam device and a sample production method. The sample production method provides a technique capable of removing a damaged layer of a sample piece generated through focused ion beam (FIB) fabrication. This method ensures that the removal is sufficient yet minimal. The charged particle beam device he developed is characterized by high sensitivity, allowing for the detection of charged particles emitted from a sample at high resolution. An absorption current detector is utilized to detect the current generated in the sample by the irradiated charged particle beam, enabling the acquisition of an absorption current image.
Career Highlights
Throughout his career, Terutaka Nanri has worked with notable companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His experience in these organizations has contributed to his expertise in charged particle beam technology and its applications.
Collaborations
Nanri has collaborated with esteemed colleagues, including Satoshi Tomimatsu and Tsuyoshi Onishi. These collaborations have further enriched his work and innovations in the field.
Conclusion
Terutaka Nanri's contributions to charged particle beam technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in this field, making him a significant figure in the realm of scientific advancements.