Terry Lee McElroy

Title: Innovations of Terry Lee McElroy

Introduction

Terry Lee McElroy is an accomplished inventor based in Arlington, MA (US). She holds a total of 3 patents that showcase her expertise in developing advanced inspection and etching technologies. Her innovative contributions have significantly impacted various industries.

Latest Patents

One of her latest patents is titled "Methods to perform backscatter inspection of complex targets in confined spaces." This invention includes features that enable inspection of irregular surfaces and hard-to-reach places. The system is designed with arms that can maneuver a scan head with at least three or seven degrees of freedom. Additionally, it incorporates proximity detectors that can detect contact with the object being inspected, allowing the system to slow or stop its motion accordingly. Another notable patent is the "Edge bevel removal apparatus and method." This invention describes a substrate edge bevel etch module that etches material from the peripheral edge of a substrate using a surface tension etch applicator. The design ensures that the etchant is retained using surface tension forces, forming a meniscus between the wetted etching surface and the substrate surface.

Career Highlights

Terry has worked with notable companies such as American Science and Engineering, Inc. and Tel Nexx, Inc. Her experience in these organizations has allowed her to refine her skills and contribute to significant technological advancements.

Collaborations

Throughout her career, Terry has collaborated with talented individuals, including Jim Pascoe and Jeffrey R. Schubert. These partnerships have fostered innovation and creativity in her projects.

Conclusion

Terry Lee McElroy's contributions to the fields of inspection and etching technologies demonstrate her innovative spirit and dedication to advancing engineering solutions. Her patents reflect her commitment to solving complex challenges in various industries.