The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Apr. 13, 2012
Jeffrey R. Schubert, Somerville, MA (US);
John P. Handy, Nashua, NH (US);
Richard L. Schueller, Chelmsford, MA (US);
Terry Lee Mcelroy, Arlington, MA (US);
David C. Walazek, Billerica, MA (US);
William J. Baukus, Nashua, NH (US);
Jeffrey R. Schubert, Somerville, MA (US);
John P. Handy, Nashua, NH (US);
Richard L. Schueller, Chelmsford, MA (US);
Terry Lee McElroy, Arlington, MA (US);
David C. Walazek, Billerica, MA (US);
William J. Baukus, Nashua, NH (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.