Company Filing History:
Years Active: 2014
Title: John P Handy - Innovator in Backscatter Inspection Technology
Introduction
John P Handy is a notable inventor based in Nashua, NH (US). He has made significant contributions to the field of inspection technology, particularly through his innovative patent that addresses the challenges of inspecting complex targets in confined spaces. His work has implications for various industries that require precise inspection methods.
Latest Patents
John P Handy holds a patent titled "Methods to perform backscatter inspection of complex targets in confined spaces." This patent encompasses embodiments of backscatter inspection systems designed to enable inspection of irregular surfaces, tight spaces, and other hard-to-reach areas. Some embodiments feature arms that maneuver a scan head with at least three degrees of freedom, while others allow for at least seven degrees of freedom. Additionally, certain embodiments include proximity detectors on a scan head or base, which detect contact with the object being inspected and adjust the system's motion accordingly. Compact embodiments are also designed to scan the interior of an object from within, utilizing a rotating, low-energy source of penetrating radiation and at least one backscatter detector, which may be stationary or rotate with the source.
Career Highlights
John P Handy is associated with American Science and Engineering, Inc., where he has contributed to the development of advanced inspection technologies. His work has been instrumental in enhancing the capabilities of inspection systems, making them more effective in challenging environments.
Collaborations
Throughout his career, John has collaborated with notable colleagues, including Jeffrey R Schubert and Richard Schueller. These collaborations have fostered innovation and have led to advancements in the field of inspection technology.
Conclusion
John P Handy's contributions to backscatter inspection technology demonstrate his commitment to innovation and excellence. His patent reflects a deep understanding of the complexities involved in inspecting confined spaces, making a significant impact in the industry.