David C Walazek

Title: David C. Walazek: Innovator in Backscatter Inspection Technology

Introduction

David C. Walazek is a notable inventor based in Billerica, MA (US). He has made significant contributions to the field of inspection technology, particularly through his innovative patent that addresses the challenges of inspecting complex targets in confined spaces.

Latest Patents

David C. Walazek holds a patent for "Methods to perform backscatter inspection of complex targets in confined spaces." This patent includes embodiments of backscatter inspection systems designed to enable inspection of irregular surfaces, tight spaces, and other hard-to-reach areas. Some embodiments feature arms that maneuver a scan head with at least three degrees of freedom, while others allow for at least seven degrees of freedom. Additionally, some compact embodiments are capable of scanning the interior of an object from within, utilizing a rotating, low-energy source of penetrating radiation, along with at least one backscatter detector.

Career Highlights

David is associated with American Science and Engineering, Inc., where he has been instrumental in developing advanced inspection technologies. His work has significantly impacted the efficiency and effectiveness of inspection processes in various industries.

Collaborations

Throughout his career, David has collaborated with notable colleagues, including Jeffrey R. Schubert and John P. Handy. These collaborations have further enhanced the development of innovative solutions in the field of inspection technology.

Conclusion

David C. Walazek's contributions to backscatter inspection technology demonstrate his commitment to innovation and excellence. His work continues to influence the industry, paving the way for more effective inspection methods.