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For the Inventor, By the Inventor

Kyoto, Japan

Takeshi Ono

This inventor holds 10 USPTO granted patents and 1 published patent application. Top assignee: Shimadzu Corporation. Active years: 2023-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Ono. Retrieved from https://idiyas.com/inventor/takeshi-ono-k79ymsa0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10 

% Patents Active = 70.0

Average Co-Inventor Count = 2.6

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:

goldMedal10 out of 3,703 
 
Shimadzu Corporation
 patents

Years Active: 2023-2026

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10 patents (USPTO):Explore Patents
1. 12718604 - Cell image analysis system (2026-08-25),
2. 12602912 - Memory capacity determination system in learning of cell images and memory capacity determination method in learning of cell images (2026-04-14),
3. 12572507 - Data processing system, data processing method, and computer program for executing data processing method using information processing device (2026-03-10),
4. 12417619 - Image analyzing device (2025-09-16),
5. 12393411 - Data analysis apparatus and data analysis method (2025-08-19),
6. 12347088 - Data processing system (2025-07-01),
7. 12333780 - Migration system of learning model for cell image analysis and migration method of learning model for cell image analysis (2025-06-17),
8. 12067224 - Data processing system (2024-08-20),
9. 11835597 - Magnetic detection system, magnetic signal waveform pattern classification method, and waveform pattern distribution generation method for magnetic detection system (2023-12-05),
10. D978167 - Display screen or portion thereof with graphical user interface of a cell image analyzer (2023-02-14),

Title: The Innovative Contributions of Takeshi Ono

Introduction

Takeshi Ono is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of data analysis and image processing, holding a total of 10 patents. His work is characterized by a focus on advanced technologies that enhance the efficiency and accuracy of data analysis.

Latest Patents

One of Takeshi Ono's latest patents is an image analyzing device. This device includes an image holder that securely holds an image, a trained model registration part for registering models created by machine learning, and a trained model holder that maintains these models. Additionally, it features an algorithm holder that contains various analysis algorithms for executing image analysis. The device also has a recipe creation part that generates an analysis recipe by combining a selected trained model and an analysis algorithm. Finally, an analysis execution part is responsible for executing the analysis based on the created recipe.

Another notable patent is a data analysis apparatus and method. This apparatus includes a control unit that manages the selection of analysis data and scripts for executing analysis in parallel. It also features a display unit that presents the analysis results on the same screen, allowing for a comprehensive view of the data being analyzed.

Career Highlights

Takeshi Ono is currently employed at Shimadzu Corporation, a leading company in the field of precision instruments and analytical equipment. His role at the company has allowed him to develop and refine his innovative ideas, contributing to the advancement of technology in data analysis.

Collaborations

Throughout his career, Takeshi has collaborated with talented individuals such as Shuhei Yamamoto and Ryuji Sawada. These collaborations have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Takeshi Ono's contributions to the field of data analysis and image processing are noteworthy. His innovative patents and work at Shimadzu Corporation highlight his commitment to advancing technology. His collaborations with other skilled professionals further enhance his impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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