The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Oct. 25, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Ryuji Sawada, Kyoto, JP;

Takeshi Ono, Kyoto, JP;

Shuhei Yamamoto, Kyoto, JP;

Hiroaki Tsushima, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 8/41 (2018.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 8/45 (2013.01); G06N 20/00 (2019.01);
Abstract

A data analysis apparatus includes a control unit that performs control of receiving an operation to select analysis data, control of receiving an operation to select a plurality of scripts that execute analysis on the selected analysis data, and control of executing analysis on the selected analysis data by the plurality of selected scripts in parallel. The data analysis apparatus also includes a display unit configured to display analysis results of the analysis data by the control unit on the same screen.


Find Patent Forward Citations

Sawada, Ryuji. (2025). Data analysis apparatus and data analysis method (U.S. Patent No. 12393411). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12393411

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…