The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Aug. 27, 2020
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Takeshi Ono, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/00 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0206 (2013.01); G01R 33/0005 (2013.01); G01R 33/091 (2013.01);
Abstract

The magnetic detection system () is provided with a magnetic sensor () and a waveform pattern classification unit (). The waveform pattern classification unit () is configured to classify waveform patterns of magnetic signals acquired by the magnetic sensor () based on a waveform pattern distribution () generated based on a plurality of fully connected layers () generated by weighting and connecting respective features in waveform patterns for each waveform pattern by machine-learning, and features in the waveform patterns of the magnetic signals.


Find Patent Forward Citations

Ono, Takeshi. (2023). Magnetic detection system, magnetic signal waveform pattern classification method, and waveform pattern distribution generation method for magnetic detection system (U.S. Patent No. 11835597). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11835597

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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