The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Apr. 27, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Ryuji Sawada, Kyoto, JP;

Shuhei Yamamoto, Kyoto, JP;

Takeshi Ono, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06T 7/00 (2017.01); G06V 10/70 (2022.01); G06V 10/776 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06T 7/0012 (2013.01); G06V 10/776 (2022.01); G06V 10/87 (2022.01); G06V 20/69 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30072 (2013.01);
Abstract

An image analyzing device () includes an image holder () that holds an image, a trained model registration part () configured to register trained models created by machine learning, a trained model holder () that holds the trained models registered by the trained model registration part (), an algorithm holder () that holds a plurality of analysis algorithms for executing analysis processing of an image, a recipe creation part () configured, for an image to be analyzed optionally selected from among images held in the image holder (), to create an analysis recipe for analyzing the image to be analyzed by combining a trained model selected from the trained models held in the trained model holder () and an analysis algorithm optionally selected from the plurality of analysis algorithms held in the algorithm holder (), and an analysis execution part () configured to execute analysis of the image to be analyzed based on the analysis recipe created by the recipe creation part ().


Find Patent Forward Citations

Sawada, Ryuji. (2025). Image analyzing device (U.S. Patent No. 12417619). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12417619

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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