Company Filing History:

9 out of 39,237

Fujitsu Corporation

patents

1 out of 467

Fujitsu Microelectronics Limited

patents

Years Active: 2000-2013

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10 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8503259 - Memory test method and memory test device (2013-08-06),

2. 8143901 - Test apparatus, test method, and integrated circuit (2012-03-27),

3. 7689836 - Encryption device (2010-03-30),

4. 6643730 - CPU controlled memory controlling device for accessing operational information (2003-11-04),

5. 6625712 - Memory management table producing method and memory device (2003-09-23),

6. 6449681 - Memory unit and buffer access control circuit for updating an address when consecutively accessing upper and lower buffers (2002-09-10),

7. 6418501 - Memory card (2002-07-09),

8. 6339809 - Memory unit and buffer access control circuit for updating an address when consecutively accessing upper and lower buffers (2002-01-15),

9. 6289411 - Circuit for generating a chip-enable signal for a multiple chip configuration (2001-09-11),

10. 6154808 - Method and apparatus for controlling data erase operations of a (2000-11-28),

Title: The Innovations of Takeshi Nagase

Introduction

Takeshi Nagase is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of technology, particularly in memory testing and integrated circuits. With a total of 10 patents to his name, Nagase's work has had a lasting impact on the industry.

Latest Patents

One of Nagase's latest patents is a memory test method and memory test device. This innovative method involves performing a memory test by sequentially generating a number of n-bit addresses. The first to k-th bits are set to one of two values, either 0 or 1, while the (k+1)th to n-th bits are set to the other value. This process is repeated for all k's ranging from 1 to n. The method includes writing first test data to each generated address, reading second test data from the memory, and comparing the two sets of data. Another notable patent is for a test apparatus, test method, and integrated circuit. This apparatus features an up counter, a down counter, a selector, an inversion circuit, and a comparison circuit, all working together to enhance testing efficiency.

Career Highlights

Throughout his career, Takeshi Nagase has worked with notable companies such as Fujitsu Corporation and Fujitsu Microelectronics Limited. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology.

Collaborations

Nagase has collaborated with talented individuals in the field, including Shinkichi Gama and Yoshihiro Takamatsuya. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Takeshi Nagase's contributions to the field of technology through his patents and collaborations highlight his innovative spirit and dedication to advancing memory testing and integrated circuits. His work continues to influence the industry and inspire future inventors.

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