Company Filing History:
Years Active: 2017-2025
Title: Takehide Hirata: Innovator in Abnormality Diagnosis Systems
Introduction
Takehide Hirata is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of abnormality diagnosis systems, holding a total of 9 patents. His work focuses on improving the accuracy of diagnosing equipment abnormalities, which is crucial in various industrial applications.
Latest Patents
Hirata's latest patents include an abnormality diagnosis system and an abnormality diagnosis method. These innovations aim to prevent the misdiagnosis of equipment as having an abnormality when it does not. The abnormality diagnosis system comprises a sampler and a calculator. The calculator is designed to perform a first abnormality determination based on the results of a principal component analysis. If the first determination indicates an abnormality, a second determination is conducted using another principal component analysis. If the second determination also indicates an abnormality, the equipment is diagnosed as having an issue.
Another notable patent is the process state monitoring device and method. This device includes a processor that separates multiple components from time series data indicating the state of a process. It computes characteristic values from each separated component and classifies the state of the process based on these values.
Career Highlights
Takehide Hirata is currently employed at JFE Steel Corporation, where he continues to innovate and develop advanced diagnostic systems. His work has been instrumental in enhancing the reliability of equipment monitoring in industrial settings.
Collaborations
Hirata has collaborated with notable colleagues, including Masafumi Matsushita and Kazuro Tsuda. Their combined expertise has contributed to the advancement of technologies in the field of abnormality diagnosis.
Conclusion
Takehide Hirata's contributions to the field of abnormality diagnosis systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in equipment monitoring and diagnosis.