The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Jun. 18, 2014
Jfe Steel Corporation, Tokyo, JP;
Kazuro Tsuda, Tokyo, JP;
Takehide Hirata, Tokyo, JP;
Naoshi Yamahira, Tokyo, JP;
Hidekazu Abe, Tokyo, JP;
JFE STEEL CORPORATION, Tokyo, JP;
Abstract
An abnormality detection method of detecting abnormality of a blast furnace from tuyere images shot by cameras installed in vicinities of a plurality of tuyeres of the blast furnace includes: collecting, in a time-series manner, representative brightness vectors defined by representative brightnesses determined based on brightness values of respective pixels for each of the tuyeres image previously shot by the cameras at a same time; extracting a principal component vector by performing principal component analysis on the representative brightness vectors collected in the time-series manner; calculating, as an evaluation value, a length of a normal line drawn in a direction of the principal component vector from the representative brightness vector collected from the tuyere images shot by the cameras at the same time during an operation; and detecting the abnormality of the blast furnace by comparing the evaluation value with a predetermined threshold.