The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Dec. 21, 2020
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Tetsushi Nagano, Tokyo, JP;

Takehide Hirata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 2223/02 (2018.08);
Abstract

Provided are an abnormality diagnosis system and an abnormality diagnosis method that can prevent wrongly diagnosing equipment as having an abnormality when the equipment actually does not have an abnormality. An abnormality diagnosis systemcomprises a samplerand a calculatorThe calculatoris configured to: perform first abnormality determination of whether there is an abnormality based on a result of first principal component analysis; in the case where a result of the first abnormality determination is that there is an abnormality, and perform second abnormality determination of whether there is an abnormality based on a result of second principal component analysis; and in the case where a result of the second abnormality determination is that there is an abnormality, diagnose the equipment as having an abnormality.


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