The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Mar. 30, 2018
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Naoshi Yamahira, Tokyo, JP;

Takahiro Nishino, Tokyo, JP;

Takehide Hirata, Tokyo, JP;

Kazuro Tsuda, Tokyo, JP;

Toshiki Tsuboi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); G01N 15/02 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/088 (2013.01); G01N 15/1475 (2013.01); G01N 2015/025 (2013.01); G01N 2015/144 (2013.01); G01N 2015/1465 (2013.01);
Abstract

Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.


Find Patent Forward Citations

Loading…