The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Nov. 29, 2017
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Naoshi Yamahira, Tokyo, JP;

Takahiro Nishino, Tokyo, JP;

Takehide Hirata, Tokyo, JP;

Kazuro Tsuda, Tokyo, JP;

Toshiki Tsuboi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C21B 5/06 (2006.01); G06T 7/00 (2017.01); C21B 5/00 (2006.01); C21B 7/24 (2006.01); G01N 21/47 (2006.01); G01N 21/17 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); C21B 5/006 (2013.01); C21B 5/007 (2013.01); C21B 5/008 (2013.01); C21B 7/24 (2013.01); G01N 21/4738 (2013.01); G01N 2021/1765 (2013.01); G01N 2021/8592 (2013.01);
Abstract

A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.


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