Company Filing History:
Years Active: 2005-2012
Title: The Innovative Contributions of Takaji Ishikawa
Introduction
Takaji Ishikawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device testing, holding a total of five patents. His work focuses on enhancing the efficiency and effectiveness of probe cards and related technologies.
Latest Patents
Ishikawa's latest patents include a connection board, a probe card, and an electronic device test apparatus comprising the same. The probe card features probe needles that electrically contact input/output terminals of an integrated circuit (IC) device formed on a semiconductor wafer. It includes a mount base for the probe needles, a support column, and a circuit board with interconnect patterns connected to the probe needles via bonding wires. Notably, the mount base and the circuit board are designed to be non-contact. Another patent involves a contact pin probe card that supplies signals to a wafer terminal. This contact pin is constructed with a first conductive layer made of a harder material and a second conductive layer of a softer material, both designed to enhance the contact with the wafer terminal.
Career Highlights
Ishikawa has established himself as a key figure in the field of electronic testing technologies. His innovative designs have contributed to advancements in the efficiency of testing processes for semiconductor devices. He is currently associated with Advantest Corporation, a leading company in the semiconductor testing industry.
Collaborations
Throughout his career, Ishikawa has collaborated with notable colleagues, including Fumio Kurotori and Tadao Saito. These collaborations have further enriched his work and contributed to the development of cutting-edge technologies in the field.
Conclusion
Takaji Ishikawa's contributions to electronic device testing through his innovative patents and collaborations highlight his importance in the industry. His work continues to influence advancements in semiconductor technology and testing methodologies.