The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Jun. 14, 2005
Applicants:
Takaji Ishikawa, Tokyo, JP;
Fumio Kurotori, Tokyo, JP;
Tadao Saito, Tokyo, JP;
Inventors:
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A probe cardis composed of a plurality of probe pinshaving wafer-side plungersat one end portion and substrate-side plungerson the other end side; two probe guidesandone above the other for supporting the plurality of probe pinsso that the plurality of probe pinsare arranged to be corresponding to an arrangement of external terminals of a semiconductor wafer and the wafer-side plungersof the probe pinsprotrude; a print substratehaving padsfor the substrate-side plungersof the probe pinssupported by the probe guidesandto contact; and a stiffenerprovided on the back surface of the print substrate