Fumio Kurotori

Title: Fumio Kurotori: Innovator in Semiconductor Testing Technology

Introduction

Fumio Kurotori is a prominent inventor based in Tokyo, Japan, known for his significant contributions to semiconductor testing technology. With a remarkable portfolio of 13 patents, Kurotori has played a pivotal role in advancing the efficiency and accuracy of electronic device testing.

Latest Patents

Among his latest patents, Kurotori includes innovations such as the "Contact Pin Probe Card and Electronic Device Test Apparatus Using Same." This invention features a contact pin designed for connecting to wafer terminals while supplying signals. The contact pin consists of a first conductive layer made from a hard material and a second conductive layer with softer properties, cleverly designed to optimize contact performance. His probe card invention is another significant development, which comprises a system of multiple probe pins arranged to correspond with the external terminals of semiconductor wafers, ensuring precise testing through a well-structured design.

Career Highlights

Fumio Kurotori has built a strong career, having worked with notable companies such as Fujitsu Takamisawa Component Limited and Advantest Corporation. His work experience in these esteemed organizations has enriched his expertise in the field, allowing him to push the boundaries of innovation in semiconductor technology.

Collaborations

Throughout his career, Kurotori has collaborated with distinguished colleagues like Hideo Miyazawa and Osamu Daikuhara. These partnerships have fostered a dynamic exchange of ideas, enhancing the development of cutting-edge solutions in electronic testing applications.

Conclusion

Fumio Kurotori exemplifies the spirit of innovation, constantly striving to advance semiconductor testing techniques through his inventions. With a solid track record of patents and valuable collaborations, Kurotori continues to influence the field and inspire future inventors in the quest for technological excellence.