Tai-Kam Ng

Title: Innovations by Tai-Kam Ng

Introduction

Tai-Kam Ng is a notable inventor based in San Jose, CA, who has made significant contributions to the field of semiconductor inspection technology. With a total of 2 patents, his work focuses on enhancing the accuracy and efficiency of defect detection in semiconductor manufacturing processes.

Latest Patents

One of Tai-Kam Ng's latest patents involves creating and tuning a classifier to capture more defects of interest during inspection. This innovation allows images of a semiconductor wafer to be received at a deep learning classification module. The images can be sorted into soft decisions, enabling the determination of a class of the defect of interest for each image. The deep learning classification module can communicate electronically with an optical inspection system or other types of semiconductor inspection systems.

Another significant patent by Ng is related to decision tree construction for automatic classification of defects on semiconductor wafers. This method includes creating a decision tree for classifying defects detected on a wafer by altering one or more floating trees within the decision tree. These floating trees are manipulated as individual units, and the method also involves classifying the defects detected on the wafer by applying the decision tree to the defects.

Career Highlights

Tai-Kam Ng is currently employed at Kla Tencor Corporation, a leading company in the semiconductor inspection industry. His work at Kla Tencor has allowed him to apply his innovative ideas and contribute to advancements in semiconductor technology.

Collaborations

Some of Tai-Kam Ng's coworkers include Erfan Soltanmohammadi and Martin Plihal, who collaborate with him on various projects within the company.

Conclusion

Tai-Kam Ng's contributions to semiconductor inspection technology through his patents demonstrate his commitment to innovation in the field. His work continues to influence the industry and improve defect detection processes.