Taher E Kagalwala

Title: Innovations of Taher E Kagalwala

Introduction

Taher E Kagalwala is a notable inventor based in Wappingers Falls, NY (US). He has made significant contributions to the field of semiconductor fabrication, holding a total of 4 patents. His work focuses on enhancing the manufacturing processes of semiconductor devices through innovative techniques.

Latest Patents

Kagalwala's latest patents include a method for process control of semiconductor fabrication based on spectra quality metrics. This process control method involves determining a quality metric of a production semiconductor wafer by comparing production scatterometric spectra with reference scatterometric spectra. The method utilizes machine learning to link reference spectra to measurement values, allowing for precise control of the fabrication process. Another notable patent involves measuring complex structures in semiconductor fabrication, specifically targeting SRAM structures with FinFET transistors. This patent details a process for obtaining spectra of production structures and fitting reference spectra to determine measurement values for FinFET gates.

Career Highlights

Throughout his career, Kagalwala has worked with prominent companies in the semiconductor industry, including GlobalFoundries Inc. and Nova Measuring Instruments Ltd. His expertise in semiconductor technology has positioned him as a valuable asset in these organizations.

Collaborations

Kagalwala has collaborated with several professionals in his field, including Alok Vaid and Sridhar Mahendrakar. These collaborations have contributed to the advancement of semiconductor fabrication techniques.

Conclusion

Taher E Kagalwala's innovative work in semiconductor fabrication has led to significant advancements in the industry. His patents reflect a deep understanding of complex manufacturing processes and a commitment to improving technology.