Hitachinaka, Japan

Tadanori Takahashi

This inventor holds 3 USPTO granted patents. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd.. Active years: 2000-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadanori Takahashi. Retrieved from https://idiyas.com/inventor/tadanori-takahashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 66.7

Average Co-Inventor Count = 9.0

ph-index = 2

Forward Citations = 44(Granted Patents)


Company Filing History:


Years Active: 2000-2008

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3 patents (USPTO):Explore Patents

Title: Innovations by Inventor Tadanori Takahashi

Introduction: Tadanori Takahashi, an esteemed inventor located in Hitachinaka, Japan, has made significant contributions to the field of measurement techniques in scanning electron microscopy. With three patents to his name, he has developed innovative methods aimed at enhancing the precision of width measurements on materials.

Latest Patents: Among his notable patents, Tadanori Takahashi's latest inventions include two groundbreaking techniques designed to improve measurement accuracy. The first is a method and scanning electron microscope for measuring the width of materials on samples. This invention focuses on reducing or eliminating errors in width measurement, which often arise from the beam diameter dimensions. The method utilizes a secondary signal derived from secondary particles emitted from the sample, enabling correction of width-measured values based on beam diameter dimensions. The second patent mirrors this innovation, providing a detailed approach to dimension measurement on samples, reinforcing the accuracy of the width-measurement process.

Career Highlights: Tadanori Takahashi has enjoyed a robust career, having worked for reputable companies such as Hitachi High Technologies Corporation and Hitachi, Ltd. His tenure at these organizations has allowed him to refine his expertise and engage in advanced research and development efforts to push the boundaries of measurement technologies.

Collaborations: Throughout his career, Takahashi has collaborated with esteemed colleagues, including Goroku Shimoma and Mitsugu Sato. These partnerships have fostered a collaborative environment that has been pivotal in the advancement of innovative measurement methods, enabling significant progress in their respective fields.

Conclusion: Tadanori Takahashi's contributions to the field of measurement techniques in scanning electron microscopy exemplify innovation and dedication to improvement. His patents reflect a commitment to enhancing precision in scientific measurements, and his collaborations further demonstrate the value of teamwork in driving technological advancements. As he continues to open new pathways in measurement technology, Tadanori Takahashi remains a key figure in the realm of scientific innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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