Company Filing History:
2 out of 299 
2 out of 719 
Years Active: 2015-2018
Title: Sylvain Perrot: Innovator in Dimensional Measurement Technologies
Introduction
Sylvain Perrot is a notable inventor based in Palaiseau, France. He has made significant contributions to the field of dimensional measurement technologies, particularly in the context of multilayer objects such as wafers. With a total of 4 patents to his name, Perrot's work has advanced the capabilities of imaging devices and measurement methods.
Latest Patents
One of Sylvain Perrot's latest patents is a device and method for making dimensional measurements on multilayer objects such as wafers. This innovative imaging device is designed to localize structures through the surface of an object, allowing for precise positioning of measuring sensors. The device includes an imaging sensor, an optical imager that produces an image of the object, and an illuminator that generates an illuminating beam tailored to the object's nature. This technology enables the light to penetrate the object effectively.
Another significant patent by Perrot is a method and device for controllably revealing structures buried in objects like wafers. This imaging method inspects for enclosed structures, such as vias, using an imaging sensor and an optical imager. The process involves acquiring two images of the object with different illuminating beams and comparing them to identify structures that are visible in one image but not in the other.
Career Highlights
Throughout his career, Sylvain Perrot has worked with prominent companies, including Unity Semiconductor Corporation and Essilor International. His experience in these organizations has contributed to his expertise in the field of imaging and measurement technologies.
Collaborations
Perrot has collaborated with notable professionals in his field, including Gilles Fresquet and Benjamin Rousseau. These collaborations have likely enriched his work and led to further innovations in dimensional measurement technologies.
Conclusion
Sylvain Perrot's contributions to the field of dimensional measurement are noteworthy, with his patents reflecting a commitment to advancing imaging technologies. His work continues to influence the industry and pave the way for future innovations.