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For the Inventor, By the Inventor

Essex Junction, VT, United States of America

Suzanne Granato

USPTO Granted Patents = 9

Average Co-Inventor Count = 4.9

ph-index = 3

Forward Citations = 42(Granted Patents)


Company Filing History:

goldMedal9 out of 164,108 
 
International Business Machines Corporation
 patents

Years Active: 2007-2015

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9 patents (USPTO):
1. 8935586 - Staggered start of BIST controllers and BIST engines (2015-01-13),
2. 8612813 - Circuit and method for efficient memory repair (2013-12-17),
3. 8452566 - Warranty monitoring and enforcement for integrated circuit and related design structure (2013-05-28),
4. 8407633 - Dynamically reconfigurable self-monitoring circuit (2013-03-26),
5. 8381052 - Circuit and method for efficient memory repair (2013-02-19),
6. 8103998 - Verifying non-deterministic behavior of a design under test (2012-01-24),
7. 7831879 - Generating test coverage bin based on simulation result (2010-11-09),
8. 7360138 - Verification of the design of an integrated circuit background (2008-04-15),
9. 7251794 - Simulation testing of digital logic circuit designs (2007-07-31),

Title: **Suzanne Granato: A Pioneer in Built-In Self-Test Innovations**

Introduction

Suzanne Granato is an accomplished inventor based in Essex Junction, Vermont, known for her significant contributions to the field of built-in self-test (BIST) technologies. With a total of nine patents to her name, Granato has demonstrated her expertise and innovative spirit in creating systems that enhance the reliability and efficiency of integrated circuits. Her work has been pivotal in advancing testing methodologies within the semiconductor industry.

Latest Patents

Among her latest innovations are two noteworthy patents. The first, titled "Staggered Start of BIST Controllers and BIST Engines," provides an innovative approach wherein each BIST controller operates with a unique start count value. This allows for staggered testing across different BIST domains, enabling a more organized and effective testing process. The second patent, "Circuit and Method for Efficient Memory Repair," outlines a method for pausing BIST operations upon detecting memory faults, thereby allowing for real-time analysis and repair solutions to be calculated as normal operations resume. These patents not only showcase Granato's technical acumen but also her dedication to solving complex problems in electronic testing.

Career Highlights

Granato is a part of the esteemed team at International Business Machines Corporation (IBM), a leader in technological innovations. Her work at IBM has positioned her at the forefront of advancements in semiconductor testing, where she collaborates with other talented professionals to push the boundaries of what is possible in integrated circuit design and testing.

Collaborations

Suzanne is known for her collaborative spirit, working closely with notable colleagues such as Francis A. Kampf and Kevin William Gorman. These partnerships have led to fruitful innovations in BIST methodologies, highlighting the importance of teamwork in the development of groundbreaking technologies.

Conclusion

In conclusion, Suzanne Granato stands out as a remarkable inventor whose contributions have made significant impacts on the field of semiconductor technologies. With her innovative patents and collaborative work at IBM, she illustrates the vital role of inventors in advancing technology. As the landscape of integrated circuits continues to evolve, Granato's expertise will undoubtedly inspire future innovations within the industry.

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