International Business Machines Corporation

Suzanne Granato

Francis A Kampf

Michael Richard Ouellette

Kevin William Gorman

Barbara L Powers

Kenneth Joseph Goodnow

Peter Albert Twombly

Jesse Ethan Craig

Valerie Hornbeck Chickanosky

Kyle E Schneider

Jonathan P Ebbers

Eze Kamanu

Todd Edwin Leonard

Michael Anthony Ziegerhofer

Nancy H Pratt

Adam J Courchesne

Rafael Blanco

Douglas Thomas Massey

Bruce J Ditmyer

Valarie H Chickanosky

Ramnath Ravindran

Susan Farmer Bueti

Louis Stermole

Each register in each built-in self-test (BIST) controller contains a BIST controller-specific start count value that is different from at least one other BIST controller-specific start count. A test controller provides a start command simultaneously to all the BIST controllers. This causes each of the BIST controllers to simultaneously begin a countdown of the BIST controller-specific start count values, using a counter. Each of the BIST controllers starts a test procedure in a corresponding BIST domain when the countdown completes (in the corresponding BIST controller). Thus, the test procedure starts at different times in at least two of the BIST domains based on the difference of the BIST controller-specific start count values in the different registers. Further, during the test procedure, each stagger controller can stagger the start of each BIST engine within the corresponding BIST domain to which the stagger controller is connected.

Staggered start of BIST controllers and BIST engines

A circuit and method of testing a memory and calculating a repair solution for a given address location includes pausing a built in self test (BIST) operation on detection of a failing memory output data of an integrated circuit. During the pause, the circuit and method analyzes 'n' number of groups of the failing memory output data during 'n' cycles using analysis logic and calculating a repair solution. Normal operations can be resumed.

Circuit and method for efficient memory repair

An integrated circuit (IC) including a warranty and enforcement system, and a related design structure and HDL design structure are disclosed. In one embodiment, an IC includes a parameter obtainer for obtaining a value of a parameter of the IC; a warranty data storage system for storing warranty limit data regarding the IC; a comparator for determining whether a warranty limit has been exceeded by comparing the value of the parameter to a corresponding warranty limit; and an action taker for taking a prescribed action in response to the warranty limit being exceeded.

Warranty monitoring and enforcement for integrated circuit and related design structure

A method configures a plurality of circuit elements for execution of an application in a first configuration. The method monitors the execution of the application on the plurality of circuit elements to produce monitoring information, using a computerized device, and stores the monitoring information in a storage structure. The method selectively communicates the monitoring information to an external element separate from the computerized device. The external element transforms the first configuration into a second configuration based on the monitoring information. The computerized device receives the second configuration from the external element and reconfigures the plurality of elements into the second configuration.

Dynamically reconfigurable self-monitoring circuit

The invention generally relates to design verification, and more particularly to verification of non-deterministic behavior of a design under test. A method includes predicting a plurality of behaviors of a design under test (DUT), and forking respective verification tasks for each one of the plurality of behaviors. The method further includes verifying an actual behavior of the DUT with each of the verification tasks, and terminating a respective one of the verification tasks when the actual behavior of the DUT does not conform to the respective one of the verification tasks.

Verifying non-deterministic behavior of a design under test

A solution for generating functional coverage bins for testing a device is disclosed. A method includes: receiving information of a failing test generated from a random simulation performed on the device; tracing a first sequence of signal events that happened in the failing test; correlating the signal events to coverage bins to generate a sequence of coverage bins; creating cross coverage event sequence bins based on the sequence of coverage bins; and outputting the created coverage event sequence bins for testing the device.

Generating test coverage bin based on simulation result

A method, apparatus, and computer program product for performing verification on an integrated circuit design having state variables. Random vectors are generated, used to simulate the design, and generate a set of values for the state variables. The generated values are compared to groups having stored values from previous stimulations and either a new group is created for the generated set of values or the existing groups accurately represent the generated set of values and they are stored in one of the existing groups.

Verification of the design of an integrated circuit background

A method and system for testing a circuit design. The method including generating a simulation model of the circuit design, the circuit design comprising one or more source latches, one or more destination latches and a logic function connected between the source latches and the destination latches; generating a modified simulation model of the simulation model by inserting random skew between an output of each source latch and an input of the logic function only in asynchronous data paths between the source latches and the destination latches of the simulation model; and running the modified simulation model.

Simulation testing of digital logic circuit designs

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Essex Junction, VT, United States of America

Suzanne Granato