The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 2010
Filed:
Feb. 19, 2008
Bruce J. Ditmyer, Westford, VT (US);
Susan Farmer Bueti, Waterbury, VT (US);
Jonathan P. Ebbers, Essex Junction, VT (US);
Suzanne Granato, Essex Junction, VT (US);
Francis A. Kampf, Jeffersonville, VT (US);
Barbara L. Powers, Hinesburg, VT (US);
Louis Stermole, Jericho, VT (US);
Bruce J. Ditmyer, Westford, VT (US);
Susan Farmer Bueti, Waterbury, VT (US);
Jonathan P. Ebbers, Essex Junction, VT (US);
Suzanne Granato, Essex Junction, VT (US);
Francis A. Kampf, Jeffersonville, VT (US);
Barbara L. Powers, Hinesburg, VT (US);
Louis Stermole, Jericho, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A solution for generating functional coverage bins for testing a device is disclosed. A method includes: receiving information of a failing test generated from a random simulation performed on the device; tracing a first sequence of signal events that happened in the failing test; correlating the signal events to coverage bins to generate a sequence of coverage bins; creating cross coverage event sequence bins based on the sequence of coverage bins; and outputting the created coverage event sequence bins for testing the device.