Westford, VT, United States of America

Bruce J Ditmyer


Average Co-Inventor Count = 5.8

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Endwell, NY (US) (1991)
  • Westford, VT (US) (2010)

Company Filing History:


Years Active: 1991-2010

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2 patents (USPTO):Explore Patents

Title: Innovations of Bruce J Ditmyer

Introduction

Bruce J Ditmyer is a notable inventor based in Westford, Vermont, who has made significant contributions to the field of technology. He holds two patents that showcase his expertise in generating test coverage and measuring chip performance. His work is instrumental in enhancing the efficiency and accuracy of testing devices.

Latest Patents

One of Bruce J Ditmyer's latest patents is titled "Generating test coverage bin based on simulation result." This invention provides a solution for generating functional coverage bins for testing a device. The method involves receiving information from a failing test generated by a random simulation, tracing a sequence of signal events, correlating these events to coverage bins, and creating cross coverage event sequence bins for testing purposes.

Another significant patent is "Calculating AC chip performance using the LSSD scan path." This patent describes a method for measuring chip performance using LSSD logic to propagate signals through the LSSD scan path. The measurement data is compared to tabular data to classify the AC chip performance accurately. This approach allows for chip measurements to be made both in a manufacturing environment and after installation in a field operational environment.

Career Highlights

Bruce J Ditmyer is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to contribute to various innovative projects and advancements in technology.

Collaborations

Throughout his career, Bruce has collaborated with notable colleagues, including Carroll J Dick and Thomas L Jeremiah. These collaborations have further enriched his work and contributed to the development of innovative solutions in the tech industry.

Conclusion

Bruce J Ditmyer is a distinguished inventor whose patents reflect his commitment to advancing technology. His contributions to generating test coverage and measuring chip performance are vital for the industry. His work continues to influence the field and inspire future innovations.

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