International Business Machines Corporation

Bruce J Ditmyer

Gregory Scott Still

Thomas L Jeremiah

Francis A Kampf

Suzanne Granato

Jonathan P Ebbers

Lawrence Jones

Carroll J Dick

Barbara L Powers

Louis Stermole

Susan Farmer Bueti

A solution for generating functional coverage bins for testing a device is disclosed. A method includes: receiving information of a failing test generated from a random simulation performed on the device; tracing a first sequence of signal events that happened in the failing test; correlating the signal events to coverage bins to generate a sequence of coverage bins; creating cross coverage event sequence bins based on the sequence of coverage bins; and outputting the created coverage event sequence bins for testing the device.

Generating test coverage bin based on simulation result

Chip performance is measured using LSSD logic to propagate a signal through the LSSD scan path of the chip. The measurement data is compared to tabular data which is used to classify the AC chip performance. The use of the LSSD scan path provides an accurate overall measurement of an entire chip. The circuitry is internal to the system and does not require external test circuitry. No unique test patterns are required for a given chip design. The chip measurements can be made after installation of the chip in a field operational environment as well as during a manufacturing and testing environment. The chip measurements can be made by local execution of the testing or controlled from a remote location.

Calculating AC chip performance using the LSSD scan path

Growing community of inventors

Westford, VT, United States of America

Bruce J Ditmyer