Suryanarayana Tummala

Title: Suryanarayana Tummala: Innovator in Defect Detection Technologies

Introduction

Suryanarayana Tummala is a notable inventor based in Tirupathi, India. He has made significant contributions to the field of defect detection technologies, holding 2 patents that enhance the efficiency of inspection processes in various applications.

Latest Patents

Tummala's latest patents include innovative computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe. One of the methods involves separating defects into bins based on their locations, types, and values for parameters of a detection algorithm. This method also determines the number of defects to be selected from each bin, thereby creating a defect sample for optimizing the detection algorithm's parameters. Another patent focuses on generating information for selecting values for parameters of a detection algorithm without user intervention. This method scans a wafer area using an inspection system and default values to detect defects, subsequently selecting a portion of these defects for further analysis.

Career Highlights

Throughout his career, Tummala has worked with prominent companies such as Kla-Tencor Technologies Corporation and KLA-Tencor Corporation. His experience in these organizations has allowed him to develop and refine his innovative approaches to defect detection.

Collaborations

Tummala has collaborated with notable professionals in his field, including Chien-Huei (Adam) Chen and Barry Becker. These collaborations have contributed to the advancement of technologies in defect detection and inspection processes.

Conclusion

Suryanarayana Tummala's contributions to defect detection technologies through his patents and career experiences highlight his role as an influential inventor in this field. His work continues to impact the efficiency of inspection processes in various industries.