Steven L Haehn

Title: Innovations of Steven L. Haehn

Introduction

Steven L. Haehn is a notable inventor based in Ft. Collins, CO (US). He holds a total of 6 patents that showcase his contributions to the field of integrated circuits and silicon identification technologies. His work has significantly impacted the way defects in electrical circuits are detected and managed.

Latest Patents

One of his latest patents is titled "Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures." This invention involves a method and computer program designed to detect and locate defects in integrated circuit die by analyzing electrical parameters. The process includes identifying outliers among identically designed circuits and monitoring changes in test values to pinpoint defects.

Another significant patent is "Secure, stable on chip silicon identification." This invention describes a circuit that provides a bit string through a series of identical bit cells. Each bit cell is designed to respond to inputs in a specific manner, and the circuit ensures logical isolation of activated cells, enhancing the security and stability of silicon identification.

Career Highlights

Throughout his career, Steven has worked with prominent companies such as LSI Logic Corporation and LSI Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in the technology sector.

Collaborations

Steven has collaborated with notable individuals in his field, including James P. Yakura and William H. Harmon. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Steven L. Haehn's contributions to the field of integrated circuits and silicon identification are noteworthy. His innovative patents and collaborations reflect his commitment to advancing technology and improving defect detection methods.