The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2009
Filed:
Dec. 29, 2005
Steven L. Haehn, Ft. Collins, CO (US);
Robert B. Benware, Clackamas, OR (US);
Steven L. Haehn, Ft. Collins, CO (US);
Robert B. Benware, Clackamas, OR (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method and computer program for detecting and locating defects in integrated circuit die from stimulation of statistical outlier signatures includes receiving as input a test value of an electrical parameter measured for each of a plurality of identically designed electrical circuits, identifying one of the identically designed electrical circuits as an outlier for which the test value of the electrical parameter varies from a mean test value of the electrical parameter for the plurality of identically designed electrical circuits by at least a selected difference, monitoring the test value while subjecting a location on the outlier to a stimulus to detect a change in the test value as a function of the location, and generating as output the location for which the change in the test value is detected to identify a defect in the outlier.