Steve Clauter

Title: Innovations by Steve Clauter

Introduction

Steve Clauter is an accomplished inventor based in Tempe, Arizona. He has made significant contributions to the field of semiconductor testing, holding two patents that showcase his innovative approach to damage reduction during high current tests.

Latest Patents

One of his latest patents is titled "Damage reduction method and apparatus for destructive testing of power semiconductors." This invention provides a device and method for limiting damage to a semiconductor device under test when it fails during high current or high power testing. The system detects the occurrence of a failure and diverts power applied to the semiconductor device through a parallel path element upon detection of the failure.

Another notable patent is the "Probe needle protection method for high current probe testing of power devices." This test system includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device. It also features current limiters that are electrically coupled to the probes and a current sensor that provides a signal when detected current exceeds a threshold level. This innovation enhances the safety and reliability of high current testing.

Career Highlights

Steve Clauter works at Integrated Technology Corporation, where he continues to develop cutting-edge solutions in semiconductor technology. His work has significantly impacted the efficiency and safety of semiconductor testing processes.

Collaborations

He collaborates with notable colleagues, including Gary B Rogers and Rodney E Schwartz, who contribute to the innovative environment at Integrated Technology Corporation.

Conclusion

Steve Clauter's contributions to semiconductor testing through his patents demonstrate his commitment to innovation and safety in the industry. His work continues to influence the field and improve testing methodologies.