The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
May. 23, 2007
Gary Rogers, Mesa, AZ (US);
Steve Clauter, Tempe, AZ (US);
Rodney Schwartz, Tiki Island, TX (US);
Taichi Ukai, Tokyo, JP;
Joe Lambright, Gilbert, AZ (US);
Dave Lohr, Chandler, AZ (US);
Gary Rogers, Mesa, AZ (US);
Steve Clauter, Tempe, AZ (US);
Rodney Schwartz, Tiki Island, TX (US);
Taichi Ukai, Tokyo, JP;
Joe Lambright, Gilbert, AZ (US);
Dave Lohr, Chandler, AZ (US);
Integrated Technology Corporation, Tempe, AZ (US);
Abstract
A test system, apparatus and method for applying high current test stimuli to a semiconductor device in wafer or chip form includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, a plurality of current limiters electrically coupled to respective ones of the plurality of probes, and a current sensor electrically coupled to the plurality of probes. The current limiters are operative to limit current flow passing through a respective probe, and the current sensor is operative to provide a signal when detected current in any contact of the plurality of probes exceeds a threshold level.