Rodney E Schwartz

Title: The Innovations of Rodney E Schwartz

Introduction

Rodney E Schwartz is a notable inventor based in Tempe, AZ (US), recognized for his contributions to the field of semiconductor testing. With a total of 10 patents to his name, Schwartz has made significant advancements in methods and devices that enhance the reliability and efficiency of electronic testing.

Latest Patents

Among his latest innovations is the "Loop-back probe test and verification method." This method utilizes a loop-back test device to verify continuity between loop-back probes that are electrically connected on a probe card. The device features a first conductive region connected to a substrate and a second conductive region that is electrically isolated from the substrate. The process involves placing the first loop-back probe in contact with the first conductive region while ensuring the second loop-back probe contacts the second conductive region. This allows for the measurement of continuity between the substrate and the second conductive region.

Another significant patent is the "Damage reduction method and apparatus for destructive testing of power semiconductors." This invention provides a device and method aimed at limiting damage to a semiconductor device during high current or high power tests. The device detects failures in the semiconductor under test and diverts power through a parallel path element to minimize damage.

Career Highlights

Rodney E Schwartz has worked with Integrated Technology Corporation, where he contributed to various projects that focused on semiconductor testing and verification. His expertise in this area has led to the development of innovative solutions that address critical challenges in the industry.

Collaborations

Throughout his career, Schwartz has collaborated with notable professionals, including Gary B Rogers and Gary M Orman. These collaborations have fostered an environment of innovation and have contributed to the successful development of his patented technologies.

Conclusion

Rodney E Schwartz's work exemplifies the spirit of innovation in the field of semiconductor testing. His patents reflect a commitment to improving testing methods and reducing damage during critical evaluations. His contributions continue to influence the industry and pave the way for future advancements.