The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Jul. 27, 2012
Rodney E. Schwartz, Tiki Island, TX (US);
Steve Clauter, Tempe, AZ (US);
David Lohr, Chandler, AZ (US);
Gary Rogers, Mesa, AZ (US);
James Baggiore, Avondale, AZ (US);
Rodney E. Schwartz, Tiki Island, TX (US);
Steve Clauter, Tempe, AZ (US);
David Lohr, Chandler, AZ (US);
Gary Rogers, Mesa, AZ (US);
James Baggiore, Avondale, AZ (US);
Integrated Technology Corporation, Temp, AZ (US);
Abstract
A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.