Integrated Technology Corporation

Other

Universal Gym Equipment, Inc.

Rodney E Schwartz

Gary B Rogers

Steven T Clauter

Gary M Orman

Steve Clauter

Glenn M Wirick

Gary C Jorgensen

Joseph W Lambright

Dave Lohr

John K Geist

David Lohr

James Baggiore

Patricia B Orman

Joe Lambright

Gary D Stewart

Daniel Kosecki

Taichi Ukai

Todd M Johnson

A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, The method includes placing the first loop-back probe in electrical contact with the first conductive region, and placing the second loop-back probe in electrical contact with the second conductive region. Continuity between the substrate and the second conductive region is then measured.

Loop-back probe test and verification method

A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.

Damage reduction method and apparatus for destructive testing of power semiconductors

A method and circuit for implementing high current capability Kelvin connections and measuring the resistance of the contacts and connections to verify that the conducting path is capable of carrying the high current without damage or degraded performance. Included as well is the means and circuit for efficiently dividing a high current test stimulus current into 2 paths with low losses and voltage drops.

High current Kelvin connection and verification method

A test system, apparatus and method for applying high current test stimuli to a semiconductor device in wafer or chip form includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, a plurality of current limiters electrically coupled to respective ones of the plurality of probes, and a current sensor electrically coupled to the plurality of probes. The current limiters are operative to limit current flow passing through a respective probe, and the current sensor is operative to provide a signal when detected current in any contact of the plurality of probes exceeds a threshold level.

Probe needle protection method for high current probe testing of power devices

A system for inspecting integrated circuit probe cards using a video camera positioned to view probe points on the cards from below. A precision movement stage is used to move the video camera into a known position for viewing the probe points. Analysis of the video image and the stage position are used to determine the relative positions of the probe points.

Integrated circuit probe card inspection system

Apparatus and method for electrically generating mechanical braking torque employs direct field drive incorporating an AC alternator plus a current regulator. The stator windings of the alternator are directly coupled to the field winding via a full wave rectifier and the current regulator. The invention simplifies electrical circuitry for generating braking torque, provides wide dynamic range of torque generation, limits voltages and currents to easily manageable levels, and reduces mechanical drive train requirements. The invention produces a constant power mechanical load from essentially 0 to over 1,000 watts from an alternator of the size typically used for automotive applications.

Apparatus for providing controlled mechanical braking torque

Method and apparatus for providing controlled mechanical braking torque

A computer controlled exercise machine in which the user selects an exercise mode and its profile by programming the computer. Signals are produced by the program to control a resistive force producing device. Sensors produce data signals corresponding to the force applied to the actuating member of the system, velocity of movement and angular position which are continuously sampled at a high rate by a microprocessor operating under control of the program. The sampled data values are used to update and display performance results for the exercise and to compute the values of other parameters and, in some exercise modes, to control the amount of the resistive force.

Computer controlled exercise machine

An arrangement for sensing rotational torque in an exercise machine utilizes a torque measuring collar, which is generally tubular with a flange at each end. One flange is mounted to a stationary member, such as the frame of a machine. A shaft which is to rotate when the force is applied extends through the tubular collar to a gear box which itself is mounted only to the other flange of the torque collar and is therefore freely rotatable. The flange of the collar which is mounted to the gear box attempts to rotate in response to the torque (force) applied to the machine shaft by the user. This causes the collar to rotationally deform, i.e. twist, in the area between its two flanges. This torque proportional deformation effect occurs independent of the rotation position of the shaft as it rotates either direction through continuous circular motion. A suitable sensor, such as a strain gauge, measures the amount of twisting of the collar and converts it into an electrical signal which is proportional to the force applied by the user. This signal can be used, for example, to control the resistance that is to be overcome or worked against by the force applied to the rotational shaft.

Growing community of inventors

Tempe, AZ, United States of America

Rodney E Schwartz