Joe Lambright

Title: Joe Lambright - Innovator in High Current Probe Testing

Introduction

Joe Lambright is an accomplished inventor based in Gilbert, AZ (US). He has made significant contributions to the field of semiconductor testing, particularly with his innovative approach to high current probe testing of power devices. His work has led to the development of a unique patent that enhances the safety and efficiency of testing semiconductor devices.

Latest Patents

Joe Lambright holds a patent for a "Probe needle protection method for high current probe testing of power devices." This patent describes a test system, apparatus, and method for applying high current test stimuli to a semiconductor device in wafer or chip form. The system includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, along with current limiters and a current sensor. The current limiters are designed to limit current flow through each probe, while the current sensor provides a signal when the detected current exceeds a threshold level.

Career Highlights

Throughout his career, Joe has worked at Integrated Technology Corporation, where he has been instrumental in advancing testing methodologies for semiconductor devices. His expertise in high current testing has positioned him as a valuable asset to his team and the industry.

Collaborations

Joe collaborates with talented individuals such as Gary B Rogers and Steve Clauter, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Joe Lambright's contributions to high current probe testing have made a significant impact in the semiconductor industry. His innovative patent showcases his dedication to improving testing methods and ensuring the reliability of power devices.