Taichi Ukai

Title: The Innovations of Taichi Ukai

Introduction

Taichi Ukai is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor testing, particularly through his innovative patent. His work focuses on enhancing the safety and efficiency of high current probe testing for power devices.

Latest Patents

Taichi Ukai holds a patent for a "Probe needle protection method for high current probe testing of power devices." This invention involves a test system, apparatus, and method designed to apply high current test stimuli to semiconductor devices in wafer or chip form. The system includes multiple probes that electrically couple to respective contact points on the semiconductor device. It also features a series of current limiters that are electrically connected to the probes, as well as a current sensor that monitors the current flow. The current limiters are designed to restrict the current passing through each probe, while the current sensor provides a signal when the detected current exceeds a predetermined threshold level.

Career Highlights

Taichi Ukai has built a successful career at Integrated Technology Corporation, where he has been instrumental in developing advanced testing methodologies for semiconductor devices. His expertise in high current testing has positioned him as a key figure in the industry.

Collaborations

Throughout his career, Taichi has collaborated with several professionals, including Gary B Rogers and Steve Clauter. These partnerships have contributed to the advancement of technology in the semiconductor testing field.

Conclusion

Taichi Ukai's innovative work in high current probe testing has made a significant impact on the semiconductor industry. His patent reflects his commitment to improving testing methods and ensuring the reliability of power devices.