Company Filing History:
3 out of 1,787 
2 out of 129 
1 out of 641 
Years Active: 1991-2003
Title: The Innovative Contributions of Stefano E Concina
Introduction
Stefano E Concina is a notable inventor based in San Jose, CA, with a significant portfolio of innovations. He holds a total of 6 patents, showcasing his expertise in the field of scanning electron microscopy and related technologies. His work has contributed to advancements in imaging techniques that are crucial for various scientific and industrial applications.
Latest Patents
Among his latest patents, one notable invention is a method and apparatus for generating an image of a specimen using a scanning electron microscope (SEM). This invention involves a source unit that directs an electron beam towards a specimen, a detector for capturing emitted particles, and an image generator that creates an image based on these particles. The imaging process is controlled by specific conditions, allowing for detailed analysis of the specimen.
Another significant patent focuses on electron beam dose control for scanning electron microscopy and critical dimension measurement instruments. This system enhances image quality by adjusting the raster scan area and managing charge build-up on the specimen. By implementing techniques such as injecting inert gas to neutralize charge accumulation, Concina's innovations improve the accuracy and clarity of scanned images.
Career Highlights
Stefano E Concina has worked with prominent companies in the technology sector, including Kla Tencor Corporation and Schlumberger Technologies, Inc. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge research and development in electron microscopy.
Collaborations
Throughout his career, Concina has collaborated with esteemed colleagues, including David Lewis Adler and Douglas K Masnaghetti. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Stefano E Concina's contributions to the field of scanning electron microscopy are significant and impactful. His patents reflect a commitment to advancing imaging technologies, and his collaborations with industry leaders further enhance his influence in the field. His work continues to inspire future innovations in microscopy and imaging techniques.