Company Filing History:
Years Active: 2013-2022
Title: Innovations of Inventor Stefan Meyer
Introduction
Stefan Meyer is a prominent inventor based in Aalen, Germany. He has made significant contributions to the field of charged particle optics, holding a total of eight patents. His work focuses on advanced technologies that enhance the detection and analysis of particles.
Latest Patents
One of his latest patents is a "Charged particle optical apparatus for through-the-lens detection of particles." This invention features a charged particle optical apparatus equipped with a liner electrode in a first vacuum zone. The liner electrode generates an electrostatic objective lens field, while a second electrode surrounds a section of the primary particle beam path. Additionally, a third electrode with a differential pressure aperture allows the particle beam path to exit the first vacuum zone. A particle detector is configured to detect emitted particles that pass through the differential pressure aperture. The electrodes operate at different potentials relative to each other, enhancing the functionality of the apparatus.
Another notable patent is the "Particle beam system and method of operating a particle beam system." This system is designed to prevent the generation of induced particles and their incidence onto a detection area. It includes a method for generating a residual signal by processing the detection signal outputted during the prevention phase. The system adjusts the control value based on the residual signal to maintain it within a predetermined target range. This innovative approach allows for the effective direction of a primary particle beam onto an object while managing the induced particles.
Career Highlights
Stefan Meyer is currently employed at Carl Zeiss Microscopy GmbH, a leading company in the field of microscopy and imaging technologies. His work at this esteemed organization has allowed him to develop cutting-edge technologies that push the boundaries of particle detection and analysis.
Collaborations
Throughout his career, Stefan has collaborated with notable colleagues, including Michael Albiez and Daniel Kirsten. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.
Conclusion
Stefan Meyer is a distinguished inventor whose work in charged particle optics has led to significant advancements in the field. His innovative patents and contributions to Carl Zeiss Microscopy GmbH highlight his expertise and commitment to pushing the frontiers of technology.
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